Handler apparatus that conveys a device under test to a test socket and test apparatus that comprises the handler apparatus

ABSTRACT

Provided is a handler apparatus that conveys a device under test to a test socket, including: a socket fitting unit which the test socket fits, prior to fitting of a device holder holding the device under test to the test socket; a test-socket position detecting section that detects a relative position of the socket fitting unit with respect to the test socket in a state in which the socket fitting unit fits the test socket; an actuator that adjusts a position of the device under test on the device holder, based on the detected relative position of the socket fitting unit; and a conveyer that conveys the device holder in which the position of the device under test has been adjusted, to fit the test socket.

BACKGROUND

1. Technical Field

The present invention relates to a handler apparatus and a testapparatus.

2. Related Art

Conventionally, a handler apparatus connected to a test apparatus fortesting a device under test electrically connects a device under test tothe test apparatus, by causing a device holder holding the device undertest to fit a socket of the test apparatus (e.g., please refer to PatentDocuments No. 1 to No. 5).

Patent Document 1: Japanese Patent Application Publication No.2000-147055

Patent Document 2: Japanese Patent Application Publication No.2000-46902

Patent Document 3: Japanese Patent Application Publication No. 2009-2860

Patent Document 4: Japanese Patent Application Publication No.2011-39059

Patent Document 5: Japanese Patent Application Publication No.2011-40758

However, if the position of the electrode of the device under test doesnot correspond to the position of the electrode of the test socket inthe state in which the device holder fits the test socket, the deviceunder test cannot be electrically connected to the test socketaccurately.

SUMMARY

Therefore, it is an object of an aspect of the innovations herein toprovide a handler apparatus and a test apparatus, which are capable ofovercoming the above drawbacks accompanying the related art. The aboveand other objects can be achieved by combinations described in theclaims. According to a first aspect related to the innovations herein,provided is a handler apparatus that conveys a device under test to atest socket, including: a socket fitting unit which the test socketfits, prior to fitting of a device holder holding the device under testto the test socket; a test-socket position detecting section thatdetects a relative position of the socket fitting unit with respect tothe test socket in a state in which the socket fitting unit fits thetest socket; an actuator that adjusts a position of the device undertest on the device holder, based on the detected relative position ofthe socket fitting unit; and a conveyer that conveys the device holderin which the position of the device under test has been adjusted, to fitthe test socket.

According to a second aspect related to the innovations herein, providedis a test apparatus that includes the handler apparatus according to thefirst aspect for conveying the device under test to the test socket, thetest apparatus testing the device under test and further comprising: atest head to be electrically connected to the device under test via thetest socket; and a test module testing the device under test via thetest head.

The summary clause does not necessarily describe all necessary featuresof the embodiments of the present invention. The present invention mayalso be a sub-combination of the features described above.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 shows an exemplary configuration of a handler apparatus 100according to the present embodiment, together with a test head 110, atest module 130, a device tray 10, and a tray for adjustment 20.

FIG. 2 shows an exemplary configuration in which the handler apparatus100 according to the present embodiment has conveyed a device under test12 to a test socket 122.

FIG. 3 shows an actuator unit 320 according to the present embodiment,together with a device tray 10.

FIG. 4 shows an actuator unit 320 according to the present embodiment,together with a tray for adjustment 20.

FIG. 5 is a sectional view in X direction of the actuator unit 320 andthe tray for adjustment 20 shown in FIG. 4, together with a controlsection 340.

FIG. 6 is a sectional view in Y direction of the actuator unit 320 andthe tray for adjustment 20 shown in FIG. 4.

FIG. 7 shows an operational flow of the handler apparatus 100 accordingto the present embodiment.

FIG. 8 shows a first exemplary configuration in which a socket fittingunit 420 according to the present embodiment has fitted the test socket122.

FIG. 9 shows an exemplary configuration in which a test-socketimage-capturing section 310 according to the present embodiment capturesan image of the test socket 122 and the socket fitting unit 420 fittingeach other.

FIG. 10 shows a second exemplary configuration in which the socketfitting unit 420 according to the present embodiment has fitted the testsocket 122.

FIG. 11 shows a third exemplary configuration in which the socketfitting unit 420 according to the present embodiment has fitted the testsocket 122.

FIG. 12 shows an exemplary configuration in which the socket fittingunit 420 according to the present embodiment has fitted a socket foradjustment 430.

FIG. 13 shows an exemplary configuration in which asocket-for-adjustment image-capturing section 322 according to thepresent embodiment captures an image of the socket for adjustment 430and the socket fitting unit 420 fitting each other.

FIG. 14 shows an exemplary configuration in which the socket foradjustment 430 according to the present embodiment has fitted theactuator fitting unit 410.

FIG. 15 shows an exemplary configuration in which asocket-for-adjustment image-capturing section 322 according to thepresent embodiment captures an image of the socket for adjustment 430and the actuator fitting unit 410 fitting each other.

FIG. 16 shows an exemplary configuration in which the actuator fittingunit 410 according to the present embodiment has fitted the actuator330.

FIG. 17 shows an exemplary configuration in which an actuatorimage-capturing section 326 according to the present embodiment capturesan image of the actuator fitting unit 410 and the actuator 330 fittingeach other.

FIG. 18 an exemplary configuration in which the socket-for-adjustmentimage-capturing section 322 according to the present embodiment capturesan image of the socket for adjustment 430 and a device holder 30 fittingeach other.

FIG. 19 shows an exemplary configuration in which the actuator 330according to the present embodiment has fitted the device holder 30.

DESCRIPTION OF EXEMPLARY EMBODIMENTS

Hereinafter, some embodiments of the present invention will bedescribed. The embodiments do not limit the invention according to theclaims, and all the combinations of the features described in theembodiments are not necessarily essential to means provided by aspectsof the invention.

FIG. 1 shows an exemplary configuration of a handler apparatus 100according to the present embodiment, together with a test head 110, atest module 130, a device tray 10, and a tray for adjustment 20. Here,the test head 110 and the test module 130 are a part of the testapparatus testing the device under test 12. The handler apparatus 100 isconnected to the test head 110. The handler apparatus 100 conveys aplurality of devices under test 12 to test sockets 122 provided in thetest head 110, and electrically connects the devices under test 12 tothe test sockets 122.

The test head 110 includes a socket board 120. The socket board 120includes a plurality of test sockets 122. The test head 110 iselectrically connected to each of the plurality of devices under test 12via the plurality of test sockets 122. The test head 110 electricallyconnects the plurality of devices under test 12 connected to theplurality of test sockets 122, to the test module 130.

The test module 130 tests the devices under test 12 via the test head110. The test module 130 inputs a test signal based on a test patternfor testing the plurality of devices under test 12, to each of theplurality of devices under test 12. The test module 130 determines goodor bad of the plurality of devices under test 12 based on an outputsignal outputted from each of the devices under test 12 in response tothe test signal.

The test apparatus tests a plurality of devices under test 12, such asan analog circuit, a digital circuit, analog/digital hybrid circuit, amemory, and a system on chip (SOC). Each of the plurality of devicesunder test 12 includes an electrode such as BGA (ball grid array) or anLGA (land grid array).

Instead, the device under test 12 may include a terminal such as SOJ(small outline J-leaded), PLCC (plastic leaded chip carrier), QFP (quadflat package), or SOP (small outline package). A socket board 120includes a test socket 122 electrically connectable to an electrode, aterminal, or the like included in a device under test 12 to be tested.

The handler apparatus 100 carries in the device tray 10 and the tray foradjustment 20 to inside. The handler apparatus 100 conveys the deviceunder test 12 mounted to the device tray 10 carried in, by adjusting theposition of the device under test 12, so as to connect the device undertest 12 to the test socket 122. In addition, after the test apparatushas tested the device under test 12 carried in, the handler apparatus100 discharges the device under test 12 to outside of the handlerapparatus 100.

Here, the device tray 10 mounts thereon the device holder 30 holding thedevice under test 12. In an example, the device tray 10 includes aplurality of device holders 30, so that one device under test 12 may beassigned one device holder 30. The handler apparatus 100 conveys thedevice under test 12 together with the device holder 30 to the testsocket 122.

In an example, the device tray 10 and the device holder 30 are made ofmaterials that would not cause any stress to the device under test 12such as breaking, cracking, or deformation, even under temperatureconditions adopted in high/low temperature tests executed by the testapparatus. In addition, the tray for adjustment 20 stores a socketfitting unit 420 or the like used in adjusting the position of thedevice under test 12. The device tray 10 and the tray for adjustment 20are described later.

The handler apparatus 100 includes a heating section 210, a test section220, a heat removing section 230, a conveyer 240, a test-socketimage-capturing section 310, an actuator unit 320, and a control section340.

The heating section 210 includes a carry-in loader. The carry-in loaderloads the device tray 10 having mounted thereon the device holder 30, toinside the heating section 210. The heating section 210 controls thetemperature of the device under test 12 to a predetermined testtemperature, prior to the test in the test section 220. The handlerapparatus 100 adjusts the position of the device under test 12 on eachdevice holder 30, within the heating section 210. The heating section210 may configure a chamber including an air-tight space in which thetemperature, the atmosphere, or the like can be controlled. The heatingsection 210 includes a temperature control section 212.

The temperature control section 212 mounts thereon a device tray 10carried in the heating section 210. The temperature control section 212controls the temperature of a plurality of devices under test 12 held bythe mounted device tray 10. The temperature control section 212 maymount thereon the device tray 10, by moving in Z direction going fromthe surface of the device tray 10 opposite to the surface on which thedevices under test 12 are mounted towards the device tray 10. In anexample, the temperature control section 212 controls the temperature ofthe plurality of devices under test 12 to be substantially equal tothose under the temperature conditions of the test executed by the testapparatus according to the test program. Here, the temperature controlsection 212 may include a plurality of temperature control units 214.

In this example, a plurality of temperature control units 214 areprovided to correspond to the maximum possible number of the devicesunder test 12 mountable on the device tray 10. Each temperature controlunit 214 individually heats or cools the corresponding device under test12 together with the device holder 30 from the backside. The backside ofthe device under test 12 is the surface opposite to the electrodesurface or the terminal surface of the device under test 12 to beconnected to the test socket 122. The temperature control unit 214 maybe a thermoelement such as a Peltier element, or may be a cooler or aheater for circulating a cooling medium or a heat medium.

When each temperature control unit 214 directly controls the temperatureof each device under test 12 from the backside of the device under test12, the heating section 210 can control the temperature of the pluralityof devices under test 12 rapidly and at low consumption power, withoutrequiring accurate control of the temperature of the entire chamber.Alternatively, the temperature control section 212 may control thetemperature of each device under test 12, by controlling the temperatureof the entire chamber of the heating section 210 to be substantially thesame as the temperature condition of the test.

The test section 220 includes a space in which a plurality of devicesunder test 12 can be tested. The device tray 10 and the tray foradjustment 20 in the heating section 210 are carried in the test section220. The test section 220 may configure a chamber including an air-tightspace in which the temperature, the atmosphere, or the like arecontrolled. The test section 220 is connected to the test apparatus. Thesocket board 120 to be mounted to the test head 110 of the testapparatus is positioned in the chamber of the test section 220.

In the test section 220, the device tray 10 is conveyed to the socketboard 120, and the plurality of devices under test 12 are electricallyconnected to the test sockets 122 respectively. Also in the test section220, the tray for adjustment 20 is conveyed to the socket board 120, andthe plurality of socket fitting units 420 fit the test sockets 122respectively.

The heat removing section 230 includes a space into which the devicetray 10 and the tray for adjustment 20 are carried in from the testsection 220. The heat removing section 230 discharges the device tray 10and the tray for adjustment 20 having been carried in, to outside of theheat removing section 230. The heat removing section 230 includes adischarge loader. The discharge loader unloads, to outside of the heatremoving section 230, the device tray 10 holding a plurality of devicesunder test 12 whose temperature has been controlled in the heat removingsection 230. The heat removing section 230 may configure a chamber. Theheat removing section 230 includes a temperature control section 232.

The temperature control section 232 controls the temperature of thedevice tray 10 in the heat removing section 230. The temperature controlsection 232 heats or cools the plurality of devices under test 12 havingbeen carried in from the test section 220, from around the testtemperature to the same level as the room temperatures, by controllingthe temperature of the device tray 10. The temperature control section232 may include a thermoelement such as a Peltier element, or mayinclude a cooler or a heater for circulating a cooling medium or a heatmedium.

The conveyer 240 conveys the device tray 10 from the heating section 210to the test section 220. The conveyer 240 makes, fit the test socket122, the device holder 30 holding the device under test 12, in the testsection 220. In addition, the conveyer 240 conveys the device tray 10from the test section 220 to the heat removing section 230, after thedevice under test 12 has been tested. The conveyer 240 may receive thedevice tray 10 carried in from the carry-in loader included in theheating section 210. In addition, the conveyer 240 may transfer thedevice tray 10 to the discharge loader included in the heat removingsection 230. The conveyer 240 includes a device mounting section 242 anda driving section 246.

The device mounting section 242 is provided in the test section 220. Thedevice mounting section 242 mounts the device under test 12 held by thedevice holder 30, to a corresponding test socket 122 of the socket board120. The device mounting section 242 includes a plurality of pressingsections 244. The plurality of pressing sections 244 are provided tocorrespond to the plurality of devices under test 12. The pressingsections 244 mount the devices under test 12 to the test sockets 122respectively, by pressing the surface of the device holder 30 which isopposite to the surface holding the devices under test 12 towards thesocket board 120.

The device mounting section 242 or the pressing sections 244 may includean absorption section for absorbing the device holder 30 on the surfacefacing the device holder 30. In this case, the device mounting section242 or the pressing sections 244 remove(s) the device holders 30 mountedto the test sockets 122 by absorbing the devices under test 12 andmoving them in a direction apart from the socket board 120.

In addition, the device mounting section 242 may control the temperatureof the plurality of devices under test 12 on the device tray 10. In anexample, the device mounting section 242 controls the temperature of theplurality of devices under test 12 so as to satisfy the temperaturecondition of the test executed by the test apparatus. The devicemounting section 242 may control the temperature of each of the devicesunder test 12 in contact with the plurality of pressing sections 244.Here, each of the plurality of pressing sections 244 may control therespective temperatures individually, or alternatively, the pressingsections 244 may control the temperature of two or more pressingsections 244 collectively.

In this case, each of the pressing sections 244 individually heat orcool the surface opposite to the electrode surface or the terminalsurface of the corresponding device under test 12. The pressing sections244 may include a thermoelement such as a Peltier element, or mayinclude a cooler or a heater for circulating a cooling medium or a heatmedium. When the pressing sections 244 directly control the temperatureof the devices under test 12 respectively, from the backside of thedevices under test 12, the handler apparatus 100 can control thetemperature of the plurality of devices under test 12 rapidly and at lowconsumption power, without requiring accurate control of the temperatureof the entire chamber of the test section 220. Alternatively, the testsection 220 may include a temperature control section for controllingthe temperature of the entire chamber of the test section 220 to becomesubstantially the same as the temperature condition of the test.

The driving section 246 drives the device mounting section 242. Thedriving section 246 controls the movement of the device mounting section242, conveys the device tray 10 to the socket board 120, andelectrically connects the plurality of devices under test 12 to the testsockets 122 respectively.

The test-socket image-capturing section 310 captures an image of aplurality of test sockets 122 included in the socket board 120. Thetest-socket image-capturing section 310 captures an image of an areaincluding information indicating the position of the electrode in eachtest socket 122. The test-socket image-capturing section 310 in thisexample captures an image of a test socket 122 fitting the socketfitting unit 420. The test-socket image-capturing section 310 capturesan image of an area including a mark or the like provided for the socketfitting unit 420 and an electrode in a test socket 122. Accordingly, therelative position of the electrode in the test socket 122 with respectto the mark or the like provided for the socket fitting unit 420 isobtained. The test-socket image-capturing section 310 may perform imagecapturing either on each test socket 122, or on a plurality of testsockets 122. The test-socket image-capturing section 310 may include animage-capturing camera and a moving section for moving theimage-capturing camera, and capture the test socket 122 by moving theimage-capturing camera to the vicinity of the test socket 122 to beimage-captured.

Alternatively, the test-socket image-capturing section 310 may includean image-capturing camera and a mirror, and capture the test socket 122via the mirror using the image-capturing camera. In this case, thetest-socket image-capturing section 310 may capture the image of thetest socket 122 to be image-captured, by moving the test socket 122 bymeans of the moving section for moving the mirror or the like, and bymaking the image of the test socket 122 to be incident on theimage-capturing camera.

On the device tray 10 on which the plurality of devices under test 12are mounted, the actuator unit 320 adjusts the positions of the devicesunder test 12 respectively to the positions corresponding to theelectrodes of the test sockets 122 to be connected to the devices undertest 12. The actuator unit 320 detects the position of the electrode foreach device under test 12 in the heating section 210, and adjusts theposition of the device under test 12 so as to enable connection of theelectrode for the device under test 12 to the electrode for thecorresponding test socket 122. In addition, the actuator unit 320detects and adjusts the original point position, the driving distance,or the like of the actuator that it owns.

The control section 340 is connected to the test-socket image-capturingsection 310 and the actuator unit 320, to control the positionadjustment of the device under test 12. The control section 340 notifiesthe actuator unit 320 of the adjustment amount for the device under test12 based on the image-capturing result of the test-socketimage-capturing section 310, the detection result of the actuator unit320, or the like, to enable adjustment of the position of the deviceunder test 12. In addition, the control section 340 may controlloading/unloading/conveyance of the device tray 10 and the tray foradjustment 20, driving of the device mounting section 242, or the like,by being connected to the driving section 246, the conveyer 240, thecarry-in loader, the discharge loader, or the like.

In addition, the control section 340 may control the temperature of theplurality of devices under test 12, by being connected to thetemperature control section 212, the device mounting section 242, andthe temperature control section 232. In addition, the control section340 may notify the test apparatus of completion of mounting of theplurality of devices under test 12, after mounting the plurality ofdevices under test 12 to the test sockets 122 respectively. In thiscase, the test apparatus may test the device under test 12 in responseto the notification of mounting completion, and notify the controlsection 340 of completion or halting of the test. In response to thenotification of completion of the test, the control section 340 mountsthe device under test 12 on the device tray 10, and discharges thedevice tray 10.

FIG. 2 shows an exemplary configuration in which the handler apparatus100 according to the present embodiment has conveyed a device under test12 to a test socket 122. FIG. 2 shows an example in which the devicemounting section 242 has conveyed the device tray 10 mounted thereon tothe vicinity of the socket board 120, and the pressing section 244 hasmounted the device under test 12 to the corresponding test socket 122 bypressing the device under test 12 towards the socket board 120. In thepresent embodiment, an example in which the device under test 12includes a plurality of BGA electrodes 18 is explained.

The test socket 122 is electrically connected to the device under test12, to convey a test signal supplied from the test apparatus to thedevice under test 12. In addition, the test socket 122 conveys, to thetest apparatus, a response signal outputted by the device under test 12in accordance with the test signal. The socket board 120 includes aplurality of test sockets 122. The plurality of test sockets 122 may bealigned in both row and column direction on a surface of the socketboard 120 opposite to the test head 110. The test socket 122 includes asocket pin 124 and a plurality of electrodes 126. The plurality ofelectrodes 126 of the test socket 122 are electrically connected to theplurality of electrodes 18 included in the device under test 12.

The socket pin 124 fits the device holder 30. There may be two or moresocket pins 124 for a single test socket 122. The socket pins 124 arepreferably assigned in the vicinity of four corners of the test socket122, respectively.

The device holder 30 includes an inner unit 32, an outer unit 34, and apin insertion section 36. The inner unit 32 mounts each one device undertest 12. In an example, the inner unit 32 includes an elastic member forpressing the device under test 12 by elastic force or the like, to fixeach device under test 12. The inner unit 32 maintains the fixed andmounted state of the device under test 12, while the device under test12 is carried in the handler apparatus 100 until it is discharged.

The outer unit 34 holds the inner unit 32 to be movable. The outer unit34 may include a lock mechanism for mechanically switching whether toset the inner unit 32 to be movable with respect to the outer unit 34,or to be fixed to the outer unit 34. The inner unit 32 and the outerunit 34 include a through hole to pass through the pressing section 244.In this case, the pressing section 244 pass through the inner unit 32and the outer unit 34, to press the surface of the device under test 12opposite to the surface on which the electrodes 18 are formed.

Alternatively, the surface of the outer unit 34 opposite to the surfaceto hold the inner unit 32 may be pressed by the pressing section 244 ofthe device mounting section 242. In this case, the outer unit 34 may beprovided with a concave portion to which the pressing section 244 ispressed. Alternatively, the outer unit 34 may include a through hole toallow the pressing section 244 to pass through, and the pressing section244 may press the surface of the inner unit 32 opposite to the surfaceto hold the device under test 12.

The pin insertion section 36 is formed to correspond to the socket pin124, and fits the socket pin 124. That is, in response to the pressingsection 244 pressing the device holder 30 to the test socket 122, thepin insertion section 36 fits the socket pin 124, to electricallyconnect the electrode 18 of the device under test 12 to the electrode126 of the test socket 122.

Here, if the manufacturing accuracy or the like of the test apparatus,the handler apparatus 100 or the like becomes substantially the samelevel as the position accuracy or the like of the device under test 12due to miniaturization of the size and pitch of the electrode 18 of thedevice under test 12, there may be cases in which the device under test12 and the test socket 122 cannot be electrically connected even whenthe socket pin 124 fits the pin insertion section 36. In view of this,the handler apparatus 100 according to the present embodiment includesthe test-socket image-capturing section 310, the actuator unit 320, andso on, and uses the tray for adjustment 20 or the like to adjust, inadvance, the position of the device under test 12 to be mounted on thedevice holder 30, to cause the socket pin 124 to fit the pin insertionsection 36, thereby electrically connecting the device under test 12 tothe test socket 122.

FIG. 3 shows an actuator unit 320 according to the present embodiment,together with a device tray 10. FIG. 3 shows an example in which thedevice tray 10 is carried inside the heating section 210 by the carry-inloader, and mounted on the conveyer 240.

In an example, the device tray 10 mounts thereon a plurality of deviceholders 30 arranged in both row and column directions. The device tray10 mounts thereon the plurality of device holders 30 to correspond tothe arrangement of the test sockets 122 of the test apparatus.

In the present embodiment, an example in which device holders 30 alignedin 16 columns by 16 rows are mounted on the device tray 10 is described.In this case, the device tray 10 holds and conveys 256 devices undertest 12 at maximum. Here, the row direction of the device tray 10 isreferred to as X axis, and the column direction thereof is referred toas Y axis. In this case, the conveyer 240 moves the device tray 10 in Xaxis direction, and conveys it among the heating section 210, the testsection 220, and the heat removing section 230.

The device tray 10 includes a storage 14 for storing the device holder30 on one surface of the test section 220 facing the socket board 120.The storage 14 may be a concave formed for each of the plurality ofdevice holders 30. In addition, each storage 14 includes a through hole16 penetrating the device tray 10 from one surface to the other surface.Accordingly, the pressing section 244 included in the device mountingsection 242 may pass through the through hole 16, to press the deviceholder 30 to the test socket 122.

The actuator unit 320 is provided on the device tray 10. The actuatorunit 320 includes an actuator 330. The actuator 330 fits the deviceholder 30 prior to fitting of the device holder 30 holding the deviceunder test 12 to the test socket 122, to adjust the position of thedevice under test 12 on the device holder 30. The actuator 330 in thisexample adjusts the position of the device under test 12 on the deviceholder 30 by moving the inner unit 32 holding the device under test 12with respect to the outer unit 34. The actuator 330 adjusts the positionof the device under test 12 on the device holder 30 based on therelative position of the device under test 12 with respect to the socketfor adjustment 430 described later.

The actuator unit 320 may include a plurality of actuators 330. In thiscase, each actuator 330 adjusts the position of the corresponding deviceunder test 12. For example, a plurality of actuators 330 are provided tocorrespond to the arrangement of the column direction of the devicesunder test 12, to respectively adjust the plurality of devices undertest 12 arranged in the column direction. In this case, 16 actuators 330may be provided in the column direction (Y direction in this example).The actuator unit 320 may adjust each column of 256 devices under test12 at maximum, by moving 16 times in X direction by a distancecorresponding to the arrangement of one column of the devices under test12. Alternatively, the conveyer 240 may adjust each column of 256devices under test 12 at maximum, by moving 16 times the device tray 10in X direction by a distance corresponding to the arrangement of onecolumn of the devices under test 12.

Alternatively, actuators 330 in number smaller than 16 may be providedin Y direction. In this case, the actuator unit 320 may move in Ydirection in the heating section 210, to sequentially adjust theplurality of devices under test 12 aligned in the column direction. Inan example, when eight actuators 330 are arranged in the columndirection every other row, the eight actuators 330 respectively adjustthe eight devices under test 12 in either even or odd lines of theplurality of devices under test 12 aligned in the column direction.

Accordingly, the actuator unit 320 can adjust the total of 16 devicesunder test 12 aligned in the column direction by moving in Y directionby a distance corresponding to the arrangement of one row of the devicesunder test 12. In addition, every time the adjustment for one column hasfinished, the actuator unit 320 moves in X direction by a distancecorresponding to the arrangement of one column of the devices under test12, thereby adjusting 256 devices under test 12 at maximum respectively.Alternatively, the conveyer 240 may adjust 256 devices under test 12 atmaximum, by moving the device tray 10 in X direction by a distancecorresponding to the arrangement of one column of the devices under test12, every time the adjustment for one column has finished.

In this way, the actuator unit 320 may move in the column direction, toreduce the number of actuators 330 arranged in the column direction downto 1 at minimum. In the present embodiment, an example in which theactuator unit 320 has eight actuators 330 arranged in the columndirection every one row.

FIG. 4 shows an actuator unit 320 according to the present embodiment,together with a tray for adjustment 20. FIG. 4 shows an example in whichthe tray for adjustment 20 is carried inside the heating section 210 bythe carry-in loader, and mounted on the conveyer 240.

The tray for adjustment 20 is formed in substantially the same form asthe device tray 10 mounting the device holder 30. The tray foradjustment 20 is formed to have an outer diameter which is the same asthe outer diameter of the device tray 10, for example. The tray foradjustment 20 includes a storage 22 and a through slit 26.

For example, the storage 22 is formed in the same arrangement and thesame form as the storage 14 of the device tray 10. In addition, eachstorage 22 includes a through hole 24 penetrating the tray foradjustment 20 from one surface to the other surface.

The tray for adjustment 20 mounts thereon a plurality of actuatorfitting units 410 and a plurality of socket fitting units 420. The trayfor adjustment 20 stores the actuator fitting units 410 and the socketfitting units 420 respectively in a predetermined arrangement in thestorage 22.

For example, the plurality of storages 22 for storing the plurality ofactuator fitting units 410 are arranged in the column. FIG. 4 shows anexample in which the plurality of storages 22 for storing the pluralityof actuator fitting units 410 are arranged in the first column that isopposite to the first side to be carried into the test section 220, inthe tray for adjustment 20.

In addition, in an example, the plurality of storages 22 for storing theplurality of socket fitting units 420 are arranged in one column or aplurality of columns. That is, the plurality of socket fitting units 420are arranged in a predetermined column other than the column of theplurality of storages 22 storing the plurality of actuator fitting units410.

The through slit 26 penetrates the tray for adjustment 20 from the frontsurface to the rear surface, and is formed along the plurality ofstorages 22 for storing the plurality of actuator fitting units 410.FIG. 4 shows an example in which the through slit 26 is formed on theposition of the second column adjacent to the aforementioned firstcolumn. The position of the through slit 26 in the tray for adjustment20 corresponds to the position of the second column opposite to thefirst side to be carried into the test section 220 in the device tray10. That is, the tray for adjustment 20 may have a form different fromthe form of the device tray 10, in that it has a through slit 26 insteadof the storage 22 in the second column.

The actuator fitting unit 410 fits the actuator 330 included in theactuator unit 320. The actuator fitting unit 410 fits the actuator 330by the relative position between the actuator unit 320 the tray foradjustment 20 becoming closer. The actuator fitting unit 410 hassubstantially the same form as at least the portion of the device holder30 holding the device under test 12.

The socket fitting unit 420 fits the test socket 122. The socket fittingunit 420 fits the test socket 122 as a result of the conveyer 240conveying the socket fitting unit 420 to the test socket 122 of the testsection 220.

FIG. 5 is a sectional view in X direction of the actuator unit 320 andthe tray for adjustment 20 shown in FIG. 4, together with a controlsection 340. In addition to the configuration shown in FIG. 4, theactuator unit 320 further includes a socket-for-adjustmentimage-capturing section 322, a through hole 324, an actuatorimage-capturing section 326, a link section 328, and a socket foradjustment 430. That is, an example in which the socket-for-adjustmentimage-capturing section 322, the actuator 330, and the socket foradjustment 430 are integrally formed in the actuator unit 320 isdescribed.

The socket for adjustment 430 sequentially fits the device holder 30,the actuator fitting unit 410, and the socket fitting unit 420. Bydetecting the relative position of the socket fitting unit 420 and thedevice under test 12 on the device holder 30 with respect to the socketfor adjustment 430 while fitting the socket for adjustment 430,positional difference of the device under test 12 and the socket fittingunit 420 can be detected. In addition, the socket fitting unit 420 canalso fit the test socket 122. In addition, while fitting the socketfitting unit 420, the relative position of the test socket 122 withrespect to the socket fitting unit 420 is detected. Accordingly,positional difference between the device under test 12 and the testsocket 122 can be indirectly detected. Therefore, it becomes possible todetect positional difference of the device under test 12 and the testsocket 122, prior to connection of the device under test 12 to the testsocket 122, thereby enabling to adjust, in advance, the position of thedevice under test 12.

In an example, the socket for adjustment 430 is formed on one surface ofthe actuator unit 320 opposing the device tray 10 and the tray foradjustment 20. In an example, the socket for adjustment 430 fits thedevice holder 30 by the relative position between the actuator unit 320and the device tray 10 becoming closer. In addition, the socket foradjustment 430 fits the actuator fitting unit 410 or the socket fittingunit 420 by the relative position between the actuator unit 320 and thetray for adjustment 20 becoming closer.

Here, by conveying the device tray 10 and the tray for adjustment 20 bythe conveyer 240 in Z direction, the relative positions between thedevice tray 10 and the tray for adjustment 20 with respect to theactuator unit 320 may be respectively changed, to make them closer toeach other. Instead, by movement of the actuator unit 320 in Zdirection, the relative positions between the device tray 10 and thetray for adjustment 20 with respect to the actuator unit 320 may berespectively changed.

The socket-for-adjustment image-capturing section 322 captures an imageof the socket for adjustment 430 and the device holder 30 fitting eachother, from the side of the device tray 10 at which the device holder 30is stored. In addition, the socket-for-adjustment image-capturingsection 322 captures an image of the socket for adjustment 430 and theactuator fitting unit 410 fitting each other, from the side of the trayfor adjustment 20 at which the actuator fitting unit 410 is stored. Thesocket-for-adjustment image-capturing section 322 may capture an imageof a set of a socket for adjustment 430 and a device holder 30 and animage of a set of a socket for adjustment 430 and an actuator fittingunit 410, respectively. Alternatively, the socket-for-adjustmentimage-capturing section 322 may capture respective images of a pluralityof sets of a socket for adjustment 430 and a device holder 30 and thelike.

A through hole 324 may penetrate the actuator unit 320 from one surfaceof the actuator unit 320 facing the device tray 10 and the tray foradjustment 20 to the other surface opposite to the one surface. Thethrough hole 324 is formed on at least a part of the area of theactuator unit 320 on which the socket for adjustment 430 is mounted. Thesocket-for-adjustment image-capturing section 322 captures, via thethrough hole 324, an image of the socket for adjustment 430 and thedevice holder 30 fitting each other and the socket for adjustment 430and the actuator fitting unit 410 fitting each other, from the othersurface of the actuator unit 320.

The actuator image-capturing section 326 captures an image of oneactuator 330 or a plurality of actuators 330. The actuatorimage-capturing section 326 captures an image of the actuator 330 andthe actuator fitting unit 410 from the side of the actuator fitting unit410 opposite to the actuator 330, in the state in which the actuator 330fits the actuator fitting unit 410. That is, the actuatorimage-capturing section 326 is provided for a surface of the tray foradjustment 20 opposite to the surface facing the actuator unit 320, andcaptures an image of the actuator 330 and the actuator fitting unit 410fit each other, via the through hole 24 of the tray for adjustment 20.

For example, the actuator image-capturing sections 326 are providedalong a column corresponding to the actuator 330 in the vicinity of theedge of the conveyer 240 opposite to the test section 220 in the heatingsection 210. Alternatively, the actuator image-capturing section 326 maybe provided along a column at the side opposite to the side of the trayfor adjustment 20 in which the actuator units 320 are arranged.

In the present embodiment, eight actuators 330 are arranged in thecolumn direction every other row, and therefore eight actuatorimage-capturing sections 326 may also be arranged in the columndirection every other row corresponding to the actuators 330. When theactuator image-capturing section 326 captures an image of the actuator330, the conveyer 240 conveys the tray for adjustment 20 to apredetermined position near the edge of the conveyer 240. FIG. 4 andFIG. 5 show an example in which the conveyer 240 conveys the tray foradjustment 20 to the predetermined position.

The link section 328 links the actuator image-capturing section 326 tothe actuator unit 320 in which the socket-for-adjustment image-capturingsection 322 is provided through the through slit 26. When the actuatorimage-capturing section 326 captures an image of the actuator 330, thelink section 328 links the socket-for-adjustment image-capturing section322 and the actuator image-capturing section 326.

Accordingly, when the actuator image-capturing section 326 captures theimage of a plurality of actuators 330 arranged in the column directionby moving in the column direction, the actuator image-capturing section326 can move together with the actuator unit 320. Here, when theactuator image-capturing section 326 has a mechanism moving separatelyand independently from the actuator 330, no link section 328 isrequired. In addition, while the actuator image-capturing section 326does not capture an image of the actuator 330, the link section 328 isstored in a position not in contact with any of the conveyer 240 or thetray for adjustment 20.

The control section 340 includes a socket-for-adjustment positiondetecting section 342, an actuator position detecting section 344, andan actuator adjusting section 348.

While the actuator fitting unit 410 fits the socket for adjustment 430,the socket-for-adjustment position detecting section 342 detects therelative position between the socket for adjustment 430 and the actuator330. In addition, while the socket for adjustment 430 fits the socketfitting unit 420, the socket-for-adjustment position detecting section342 detects the relative position between the socket for adjustment 430and the socket fitting unit 420. In addition, while the socket foradjustment 430 fits the device holder 30, the socket-for-adjustmentposition detecting section 342 detects the relative position between thesocket for adjustment 430 and the reference position of the deviceholder 30.

The socket-for-adjustment position detecting section 342 is connected tothe socket-for-adjustment image-capturing section 322, and based on theimage-capturing result of the socket-for-adjustment image-capturingsection 322, detects the relative position. The socket-for-adjustmentposition detecting section 342 supplies the detected relative positionto the actuator adjusting section 348.

The actuator position detecting section 344 is connected to the actuatorimage-capturing section 326, and based on the image-capturing result ofthe actuator 330 by the actuator image-capturing section 326, detectsthe distance and direction in which the actuator 330 moves. In addition,the actuator position detecting section 344 detects the relativeposition between the actuator 330 and the actuator fitting unit 410,based on the image-capturing result of the actuator 330 and the actuatorfitting unit 410 fitting each other. The actuator position detectingsection 344 supplies the detected relative position to the actuatoradjusting section 348.

The actuator adjusting section 348 is connected to the actuator 330, andmakes the actuator 330 fit the actuator fitting unit 410, and adjuststhe amount of driving of the actuator 330. The actuator adjustingsection 348 drives the actuator 330 while fitting the actuator fittingunit 410 for example, and adjusts the amount of driving based on thedistance and direction in which the actuator 330 has actually moved.

In addition, the actuator adjusting section 348 adjusts the position ofthe device under test 12 by driving the actuator 330. The actuatoradjusting section 348 calculates the position to which the device undertest 12 should be adjusted, and moves the device under test 12 to theposition by driving the actuator 330. The actuator adjusting section 348adjusts the position of the device under test 12, based on the detectionresults supplied by the socket-for-adjustment position detecting section342 and the actuator position detecting section 344.

FIG. 6 is a sectional view in Y direction of the actuator unit 320 andthe tray for adjustment 20 shown in FIG. 4. The socket-for-adjustmentimage-capturing section 322 and the socket for adjustment 430 areprovided in the actuator unit 320 in correspondence with the socketfitting unit 420. A plurality of socket-for-adjustment image-capturingsections 322 and sockets for adjustment 430 may be providedcorresponding in arrangement of the socket fitting units 420 in thecolumn direction. For example, 16 sets of socket-for-adjustmentimage-capturing sections 322 and sockets for adjustment 430 are providedin the column direction.

Alternatively, in the actuator unit 320, less than 16 sets ofsocket-for-adjustment image-capturing sections 322 and sockets foradjustment 430 may be provided in the column direction. In this case,the sockets for adjustment 430 move in Y direction in the heatingsection 210 just as the actuators 330, and the image thereof is capturedby respectively fitting the plurality of socket fitting units 420aligned in the column direction.

FIG. 6 shows an example in which the socket-for-adjustmentimage-capturing section 322 and the socket for adjustment 430 areprovided in correspondence with the socket fitting units 420 alignedevery other row in the column direction out of the plurality of socketfitting units 420, just as the actuators 330. In this case, eight setsof socket-for-adjustment image-capturing sections 322 and sockets foradjustment 430 are provided in the column direction every other row, andrespectively fit eight socket fitting units 420 in either the odd row orthe even row of the plurality of socket fitting units 420 arranged inthe column direction.

In the tray for adjustment 20, the actuator fitting units 410 arearranged in the row direction in which the socket fitting units 420, andtherefore can fit the sockets for adjustment 430 arranged in the columndirection, just as the socket fitting units 420. In addition, thesocket-for-adjustment image-capturing section 322 arranged in the columndirection can capture an image of the sockets for adjustment 430 and theactuator fitting units 410 fitting each other.

In addition, in the tray for adjustment 20, when the actuator fittingunits 410 are stored in the first column and the socket fitting units420 in the third column, by making the actuator units 320 approach thetray for adjustment 20 to cause the actuators 330 fit the actuatorfitting units 410 in the first column, it becomes possible to make thesockets for adjustment 430 fit the socket fitting units 420 in the thirdcolumn. Accordingly, the actuator image-capturing section 326 can notonly capture an image of the actuators 330, but also can thesocket-for-adjustment image-capturing section 322 capture the socketsfor adjustment 430.

The handler apparatus 100 according to the above-described embodiment,prior to carrying in the device tray 10, carries in the tray foradjustment 20, detects the relative position of each portion in theapparatus, and adjusts the position of the device under test 12 held bythe device tray 10. The operation of the handler apparatus 100 will bedescribed with reference to FIG. 7.

FIG. 7 shows an operational flow of the handler apparatus 100 accordingto the present embodiment. FIG. 8 through FIG. 19 show an exemplaryconfiguration of the handler apparatus 100 during conveyance of thedevice tray 10 and the tray for adjustment 20 by the handler apparatus100.

First, the handler apparatus 100 carries in the tray for adjustment 20(S700). The control section 340 causes the tray for adjustment 20 to becarried in the heating section 210 by the carry-in loader, and uses theconveyer 240 to convey it to the test socket 122 of the test section220. Then, the control section 340 causes the socket fitting unit 420stored in the tray for adjustment 20 by the device mounting section 242to fit the test socket 122. That is, the test socket 122 fits the socketfitting unit 420, prior to the device holder 30 holding the device undertest 12 fitting the test socket 122.

FIG. 8 shows a first exemplary configuration in which a socket fittingunit 420 according to the present embodiment has fitted the test socket122. In the present embodiment, an example in which the plurality ofsocket fitting units 420 are stored in the storages 22 in the third,fourth, sixth, eighth, tenth, twelfth, and sixteenth columns from theheating section 210 in the tray for adjustment 20 is explained. Here,the second column in the tray for adjustment 20 in FIG. 8 shows anexample in which the through slit 26 is formed.

Next, the test-socket image-capturing section 310 captures an image ofthe test sockets 122 and socket fitting units 420 in the state in whichthe socket fitting units 420 fit the test socket 122, and obtains thesocket coordinates representing the relative position of the socketfitting units 420 with respect to the test sockets 122 (S710). Thetest-socket image-capturing section 310 captures the image of the testsockets 122 and socket fitting units 420 fitting them in the third,fourth, sixth, eighth, tenth, twelfth, and sixteenth columns from theheating section 210 on the socket board 120.

Here, the control section 340 further includes a test-socket positiondetecting section 346 connected to the test-socket image-capturingsection 310. The test-socket position detecting section 346 detects therelative position of the socket fitting unit 420 with respect to thetest socket 122 in the state in which the test socket 122 fits thesocket fitting unit 420.

FIG. 9 shows an exemplary configuration in which a test-socketimage-capturing section 310 according to the present embodiment capturesan image of the test socket 122 and the socket fitting unit 420 fittingeach other. Here, the socket fitting unit 420 includes a pin insertionsection 422, a reference mark 424, and an opening 426. The pin insertionsection 422 fits the socket pin 124. That is, the socket fitting unit420 has a form that is the same as the form of at least the portion ofthe device holder 30 fitting the socket pin 124.

The reference mark 424 may be a convex, a concave, a material differentin color or reflection rate, a through hole, or the like. FIG. 9 showsan example in which a through hole is formed. The opening 426 is athrough hole that facilitates observation of an area including at leasta part of the electrode 126 of the test socket 122 in the state in whichit fits the test socket 122, from the side opposite to the surface thatthe test socket 122 fits.

The test-socket image-capturing section 310 captures an image of an areaincluding at least a part of the reference mark of the socket fittingunit 420 and the test socket 122, in the state in which the socketfitting unit 420 fits the test socket 122, from the side of the socketfitting unit 420. The area whose image is captured by the test-socketimage-capturing section 310 includes information indicating the positionof the electrode 126 of the test socket 122. In this example, theinformation indicating the position of the electrode 126 is very theelectrode 126 exposed in the opening 426 itself. In a different example,the information indicating the position of the electrode 126 may be areference mark or the like provided on the test socket 122. The opening426 may not be an area surrounded by the socket fitting unit 420. Thetest-socket position detecting section 346 detects the relative positionbetween the electrode 126 of the test socket 122 and the reference markof the socket fitting unit 420, based on the image-capturing result ofthe test-socket image-capturing section 310. That is, the test-socketposition detecting section 346 detects the relative position of theelectrode 126 of the test socket 122 with respect to the reference mark424 of the socket fitting unit 420. By adjusting the position of thedevice under test 12 to correspond to the relative position of theelectrode 126 of the test socket 122, it becomes possible to connect thetest socket 122 with the device under test 12 with accuracy.

Next, the conveyer 240 conveys the tray for adjustment 20 so as tosequentially makes the socket fitting unit 420 fit two or more testsockets 122. For example, the conveyer 240 conveys the tray foradjustment 20 the distance worth of one column of the test sockets 122,towards the heating section 210 in the row direction (X direction). Bydoing so, the socket fitting units 420 stored in the storages 22 in thethird, fourth, sixth, eighth, tenth, twelfth, and sixteenth columns canfit the test sockets 122 in the second, third, fifth, seventh, ninth,eleventh, thirteenth, and fifteenth columns from the heating section 210of the socket board 120.

The test-socket image-capturing section 310 captures an image of thetest socket 122 and the socket fitting unit 420 fitting each other fromthe side of the socket fitting unit 420. For this reason, the referencemark 424 is provided to be observable from the surface opposite to thesurface that the test socket 122 fits, in the socket fitting unit 420.

The socket fitting unit 420 also fits the socket for adjustment 430. Asdetailed later, the image of the socket fitting unit 420 and the socketfor adjustment 430 fitting each other will be captured from the side ofthe socket for adjustment 430. For this reason, the reference mark 424of the socket fitting unit 420 is provided to be observable also fromthe surface fitting the socket for adjustment 430. That is, thereference mark 424 is a mark observable from both of the surface fittingthe test socket 122 and the socket for adjustment 430 and the surfaceopposite to the surface fitting the test socket 122 and the socket foradjustment 430. In addition, the reference mark 424 of the socketfitting unit 420 is provided at a position not covered with the socketfor adjustment 430 in the state in which the socket fitting unit 420fits the socket for adjustment 430.

FIG. 10 shows a second exemplary configuration in which the socketfitting unit 420 according to the present embodiment has fitted the testsocket 122. In the state shown in FIG. 10, the test-socketimage-capturing section 310 captures an image of the test sockets 122 inthe second, fifth, seventh, ninth, eleventh, thirteenth, and fifteenthcolumns of the socket board 120 as well as the fitting socket fittingunits 420. In the socket board 120, the first column, the second column,. . . the sixteenth column are numbered starting from the end column inthe negative direction on X axis. In addition, the test-socket positiondetecting section 346 detects the relative position between theelectrode 126 of the test socket 122 in each targeted column and thereference mark on the socket fitting unit 420, respectively, based onthe image-capturing result of the test-socket image-capturing section310.

Likewise, the conveyer 240 conveys the tray for adjustment 20 one columntowards the heating section 210 in the row direction. By doing so, thesocket fitting unit 420 can fit the test sockets 122 in the first,second fourth, sixth, eighth, tenth, twelfth, and fourteenth columns ofthe socket board 120.

FIG. 11 shows a third exemplary configuration in which the socketfitting unit 420 according to the present embodiment has fitted the testsocket 122. Accordingly, the test-socket image-capturing section 310captures an image of the test socket 122 in the first column of thesocket board 120 as well as the fitting socket fitting unit 420. Inaddition, based on the image-capturing result of the test-socketimage-capturing section 310, the test-socket position detecting section346 detects the relative position between the electrodes 126 of the testsockets 122 and the reference marks of the socket fitting units 420respectively, to obtain the socket coordinates of all the test sockets122.

Next, the handler apparatus 100 makes the socket fitting unit 420 fitthe socket for adjustment 430, to obtain the first correlation betweenthe socket for adjustment 430 and the test socket 122 (S720). Forexample, when fitting the socket fitting unit 420, the first correlationincludes information indicating the positional difference between therelative position of the socket for adjustment 430 with respect to thesocket fitting unit 420 and the relative position of the test socket 122with respect to the socket fitting unit 420. In this way, the socketfitting unit 420 is sequentially caused to fit the test socket 122 andthe socket for adjustment 430. In addition, the conveyer 240 conveys thetray for adjustment 20, so as to sequentially cause the socket foradjustment 430 fit two or more socket fitting units 420. The conveyer240 may convey the tray for adjustment 20 so that all the socket fittingunits 420 stored in the tray for adjustment 20 fit the socket foradjustment 430.

FIG. 12 shows an exemplary configuration in which the socket fittingunit 420 according to the present embodiment has fitted the socket foradjustment 430. FIG. 12 shows an example in which the socket fittingunit 420 in the third column in the tray for adjustment 20 has fittedthe socket for adjustment 430. The control section 340 may control tosequentially move the conveyer 240 and/or the actuator unit 320 so thatthe socket fitting unit 420 in the other column in the tray foradjustment 20 fits the socket for adjustment 430.

The socket-for-adjustment image-capturing section 322 captures an imageof the socket for adjustment 430 and the socket fitting unit 420, in thestate in which the socket fitting unit 420 has fitted the socket foradjustment 430. FIG. 13 shows an exemplary configuration in which asocket-for-adjustment image-capturing section 322 according to thepresent embodiment captures an image of the socket for adjustment 430and the socket fitting unit 420 fitting each other.

Here, the socket for adjustment 430 includes a socket pin 432, areference mark 434, and an opening 436. The socket pin 432 fits the pininsertion section 422. That is, the socket for adjustment 430 has a formthat is the same as the form of a portion of the test socket 122 atleast fitting the device holder 30.

The reference mark 434 is a mark observable from the surface of thesocket for adjustment 430, which is opposite to the surface that thedevice holder 30 and the socket fitting unit 420 fit. The reference mark434 may be a convex, a concave, a material different in color orreflection rate, a through hole, or the like. FIG. 13 shows an examplein which a convex is formed. The opening 436 is a through hole fromwhich a part of the area of the socket fitting unit 420 is observablefrom the side opposite to the surface fitting the socket fitting unit420. In this example, the part of the area includes a reference mark424. In addition, the socket for adjustment 430 also fits the deviceholder 30. Through the opening 436, at least a part of the electrodes 18of the device under test 12 is observable from the opposite surface, inthe state fitted to the device holder 30.

The socket-for-adjustment image-capturing section 322 captures an imageof the area including at least a part of the reference mark 424 of thesocket fitting unit 420 and the socket for adjustment 430, via thethrough hole 324 and the opening 436, from the side of the socket foradjustment 430, in the state in which the socket fitting unit 420 hasfitted the socket for adjustment 430. Here, the socket-for-adjustmentimage-capturing section 322 may capture an image including the referencemark 434 of the socket for adjustment 430.

The socket-for-adjustment position detecting section 342 detects therelative position of the socket fitting unit 420 with respect to thesocket for adjustment 430 in the state in which the socket foradjustment 430 has fitted the socket fitting unit 420, based on theimage-capturing result of the socket-for-adjustment image-capturingsection 322. In an example, the socket-for-adjustment position detectingsection 342 detects, as the relative position, the distance anddirection between the reference marks 424 of the socket fitting units420 and the reference marks 434 of the sockets for adjustment 430,respectively.

The control section 340 obtains the first correlation between the socketfor adjustment 430 and the test socket 122, based on the detectedrelative position of the socket for adjustment 430 with respect to thesocket fitting unit 420 and the relative position of the test socket 122with respect to the socket fitting unit 420. For example, thesocket-for-adjustment position detecting section 342 supplies thedetected relative position to the test-socket position detecting section346. The test-socket position detecting section 346 detects thepositional difference between the relative position between the testsocket 122 and the socket fitting unit 420 and the relative positionbetween the socket fitting unit 420 and the socket for adjustment 430,as the amount of positional difference between the test socket 122 andthe socket for adjustment 430, and sets it as the first correlation. Thetest-socket position detecting section 346 may supply the detected firstcorrelation to the socket-for-adjustment position detecting section 342.

Next, the handler apparatus 100 makes the actuator fitting unit 410 fitthe socket for adjustment 430, and obtains a second correlation betweenthe test socket 122 and the actuator fitting unit 410 (S730). Here, thehandler apparatus 100 obtains the first correlation between the socketfor adjustment 430 and the test socket 122, and therefore, by detectingthe relative position between the socket for adjustment 430 and theactuator fitting unit 410, the handler apparatus 100 can obtain thecorrelation between the actuator fitting unit 410 and the test socket122.

FIG. 14 shows an exemplary configuration in which the socket foradjustment 430 according to the present embodiment has fitting theactuator fitting unit 410. The socket-for-adjustment image-capturingsection 322 captures an image of the socket for adjustment 430 and theactuator fitting unit 410 from the side of the socket for adjustment430, in the state in which the socket for adjustment 430 has fitted theactuator fitting unit 410. Here, the socket-for-adjustmentimage-capturing section 322 may sequentially capture an image of theplurality of the actuator fitting units 410 fitted the socket foradjustment 430 from the front surface of the tray for adjustment 20.FIG. 15 shows an exemplary configuration in which asocket-for-adjustment image-capturing section 322 according to thepresent embodiment captures an image of the socket for adjustment 430and the actuator fitting unit 410 fitting each other.

Here, the actuator fitting unit 410 includes an inner unit 440 and anouter unit 450. The inner unit 440 is formed to have an outer shape thatis substantially the same as the outer shape of the inner unit 32 of thedevice holder 30. That is, by obtaining the second correlation, theinner unit 440 matches in shape the inner unit 32 of the device holder30, to the extent that the correlation between the inner unit 32 of thedevice holder 30 and the test socket 122 can be obtained.

The inner unit 440 includes an opening 442 and a reference mark 444. Theopening 442 is a through hole through which at least a part of the areaof the outer unit 450 holding the inner unit 440 is observable from thesurface opposite to the surface holding the inner unit 440. Thereference mark 444 is a mark observable at both of the surface fittingthe socket for adjustment 430 and the opposite surface thereto. Thereference mark 424 may be a convex, a concave, a material different incolor or reflection rate, a through hole, or the like. FIG. 15 shows anexample in which a through hole is formed.

The outer unit 450 holds the inner unit 440 to be movable. The outerunit 450 may include a lock mechanism for mechanically switching whetherto hold the inner unit 440 to be movable. The outer unit 450 includes apin insertion section 452, a reference mark 454, and an opening 456. Thepin insertion section 452 fits the socket pin 432. That is, the outerunit 450 has a shape that is the same as the shape of the portion of thedevice holder 30 at least fitting the socket pin 124.

The reference mark 454 is a mark observable from both of the surfacefitting the socket for adjustment 430 and the actuator 330 and theopposite surface thereto. The reference mark 454 may be a convex, aconcave, a material different in color or reflection rate, a throughhole, or the like. FIG. 15 shows an example in which a through hole isformed. The reference mark 454 is formed in a position of one surfaceholding the inner unit 440, which is observable through the opening 442of the inner unit 440 from the one surface. The opening 456 is a throughhole through which at least the area of the inner unit 440 on which thereference mark 424 is formed can be observed from the side opposite tothe surface fitting the socket for adjustment 430.

Here, the socket for adjustment 430 fits the outer unit 450, to fix theposition of the outer unit 450, as well as fixing the position of theinner unit 440 by the inner wall of the opening 436. When the outer unit450 includes a lock mechanism for holding the inner unit 440, the socketfor adjustment 430 fits the outer unit 450 as well as unlocking the lockmechanism to set the inner unit 440 to be movable, and fixes theposition of the inner unit 440 by the inner wall of the opening 436.

The socket-for-adjustment image-capturing section 322 captures an imageof the socket for adjustment 430 and the actuator fitting unit 410fitted each other, from the side of the front surface of the tray foradjustment 20 through the through hole 324. The socket-for-adjustmentposition detecting section 342 detects the relative position between thesocket for adjustment 430 and the actuator fitting unit 410, based onthe image-capturing result of the socket-for-adjustment image-capturingsection 322.

Since the socket for adjustment 430 fixes the position of the inner unit440 and the outer unit 450, the socket-for-adjustment position detectingsection 342 can detect not only the relative position between the socketfor adjustment 430 and the outer unit 450 but also the relative positionwith respect to the inner unit 440. That is, the socket-for-adjustmentposition detecting section 342 detects the position of the referencemark 454 of the outer unit 450 and the position of the reference mark444 of the inner unit 440 respectively, to detect the relative positionbetween the reference mark 454 and the reference mark 444.

In addition, the socket-for-adjustment position detecting section 342has obtained the first correlation with respect to the test socket 122,and therefore can also determine the position of the reference mark 454in the test socket 122, by detecting the position of the reference mark454 of the outer unit 450. In this case, the socket-for-adjustmentposition detecting section 342 may determine the position of thereference mark 454 in the test socket 122, according to the relativeposition from the reference mark 434 of the socket for adjustment 430 tothe reference mark 454 of the outer unit 450.

Next, the handler apparatus 100 makes the actuator 330 fit the actuatorfitting unit 410, to obtain the actuator coordinates being the initialposition of the actuator 330 (S740). FIG. 16 shows an exemplaryconfiguration in which the actuator fitting unit 410 according to thepresent embodiment has fitted the actuator 330.

The actuator image-capturing section 326 captures an image of theactuator 330 and the actuator fitting unit 410 from the side of theactuator fitting unit 410, in the state in which the actuator 330 fitsthe actuator fitting unit 410. Here, the actuator image-capturingsection 326 may sequentially capture an image of the plurality ofactuator fitting units 410 fitting the actuators 330, from the rear sideof the tray for adjustment 20. The actuator adjusting section 348adjusts the amount of driving of the actuator 330 based on theimage-capturing result of the actuator image-capturing section 326 andthe socket-for-adjustment image-capturing section 322.

FIG. 17 shows an exemplary configuration in which an actuatorimage-capturing section 326 captures an image of the actuator fittingunit 410 and the actuator 330 fitting each other. Here, the actuator 330includes an outer catch section 332, an inner catch section 334, and anactuator driving section 336.

The outer catch section 332 grasps the outer unit 450 of the actuatorfitting unit 410. The outer catch section 332 has a shape that is thesame as the shape of the socket pin 124, and grasps the outer unit 450by fitting the pin insertion section 452 of the outer unit 450.

The inner catch section 334 grasps the inner unit 440. When the outerunit 450 includes a lock mechanism for holding the inner unit 440, theinner catch section 334 releases the lock provided in the inner unit 440while grasping the inner unit 440, and sets the inner unit 440 to bemovable with respect to the outer unit 450, and thereafter grasps theinner unit 440. The inner catch section 334 may have a shape that is thesame as the shape of the inner wall of the opening 436 of the socket foradjustment 430, and grasps the inner unit 440 in response to the outercatch section 332 grasping the outer unit 450.

The actuator driving section 336 is fixed to the outer catch section332, and moves the inner catch section 334. The actuator driving section336 moves the inner catch section 334 in accordance with the amount ofadjustment instructed by the actuator adjusting section 348. First, theactuator adjusting section 348 may set, as the initial position, theinner catch section 334 grasping the inner unit 440. Here, in anexample, the initial position of the inner catch section 334 may bedetermined to position the inner unit 440 to the central portion on theouter unit 450.

The actuator adjusting section 348 can detect the positional differenceof the initial position of the inner catch section 334 with respect tothe outer catch section 332, by detecting the relative position betweenthe reference mark 454 of the outer unit 450 and the reference mark 444of the inner unit 440. In addition, the actuator adjusting section 348drives the actuator 330 in the state fitting the actuator fitting unit410, and adjusts the amount of driving of the actuator 330 in the caseof adjusting the position of the device under test 12 on the deviceholder 30, based on the distance and direction in which the actuator 330has actually moved.

That is, the actuator adjusting section 348 drives the inner catchsection 334, and adjusts the amount of driving based on the distance anddirection in which the inner catch section 334 has actually moved. Here,the actuator adjusting section 348 may detect the distance and directionin which the inner catch section 334 has actually moved, in accordancewith the amount of moving of the inner catch section 334 from theinitial position.

In addition, the actuator adjusting section 348 may detect the distanceand direction in which the inner catch section 334 has actually moved,by comparing the image-capturing results of the actuator image-capturingsection 326 and the socket-for-adjustment image-capturing section 322.That is, the actuator adjusting section 348 adjusts the amount ofdriving for the actuator 330, based on the amount of positionaldifference of the actuator fitting unit 410, between when the actuatorfitting unit 410 fits the socket for adjustment 430 and when theactuator fitting unit 410 fits the actuator 330.

The control section 340 obtains the first correlation and the secondcorrelation in the handler apparatus 100, and then detects the initialposition, the moving distance, the direction, or the like of theactuator 330. Therefore, it becomes possible to reduce the variation,error, or the like of the relative position of the actuator 330 withrespect to the test socket 122, thereby driving the actuator 330 withaccuracy. The control section 340 may adjust each actuator 330separately and independently, by detecting the initial position, movingdistance, direction, and the like of the plurality of actuators 330respectively.

In response to obtaining the first correlation, the second correlation,and the coordinates of the actuator 330, the handler apparatus 100completes the adjustment by the tray for adjustment 20, and dischargesthe tray for adjustment 20 (S750). Then, the handler apparatus 100carries in the device tray 10 mounting thereon the device under test 12(S760). The control section 340 causes the device tray 10 to be carriedin the heating section 210 by the carry-in loader.

Next, the handler apparatus 100 causes the device holder 30 to fit thesocket for adjustment 430, and obtains the device coordinates being therelative position between the device under test 12 and the test socket122 (S770). That is, the socket for adjustment 430 fits the deviceholder 30 prior to causing the test socket 122 fit the device holder 30holding the device under test 12.

The socket-for-adjustment image-capturing section 322 captures an imageof the socket for adjustment 430 and the device under test 12, in thestate in which the device holder 30 fits the socket for adjustment 430.The socket-for-adjustment position detecting section 342 detects therelative position of the device under test 12 with respect to the socketfor adjustment 430 based on the image-capturing result of thesocket-for-adjustment image-capturing section 322.

FIG. 18 an exemplary configuration in which the socket-for-adjustmentimage-capturing section 322 according to the present embodiment capturesan image of the socket for adjustment 430 and a device holder 30 fittingeach other. The socket pin 432 fits the pin insertion section 36 of theouter unit 34, and the inner unit 32 is fixed by the inner wall of theopening 436 of the socket for adjustment 430. When the outer unit 34includes a lock mechanism for holding the inner unit 32, the socket foradjustment 430 fits the outer unit 34 and releases the lock mechanism,to set the inner unit 32 to be movable, and then fixes the inner unit 32by the inner wall of the opening 436.

The socket-for-adjustment image-capturing section 322 captures an imageof the area including at least a part of the electrodes 18 of the deviceunder test 12 and the reference mark 434 of the socket for adjustment430, from the surface opposite to the surface of the socket foradjustment 430 fitting the device holder 30. The socket-for-adjustmentposition detecting section 342 detects the relative position of theelectrodes 18 of the device under test 12 with respect to the socket foradjustment 430. Alternatively, the socket-for-adjustment positiondetecting section 342 may detect the relative position of the electrodes18 of the device under test 12 with respect to the reference mark 434 ofthe socket for adjustment 430.

The socket-for-adjustment position detecting section 342 detects therelative position between the inner unit 32 and the test socket 122,based on the positional difference between the inner unit 440 of theactuator fitting unit 410 and the inner unit 32 of the device holder 30caused between when the actuator fitting unit 410 fits the socket foradjustment 430 and when the device holder 30 fits the socket foradjustment 430. The socket-for-adjustment position detecting section 342can detect the relative position between the electrodes 18 of the deviceunder test 12 and the test socket 122, from the relative positionbetween the inner unit 32 and the electrode 18 and the relative positionbetween the inner unit 32 and the test socket 122.

That is, the socket-for-adjustment position detecting section 342 canobtain the device coordinates being the relative position between theelectrode 18 of the device under test 12 and the electrode 126 of thetest socket 122, when the device holder 30 fits the test socket 122.According to the device coordinates, the control section 340 candetermine the position in which the device under test 12 is to bepositioned on the device holder 30, so that the electrode 18 iselectrically connected to the electrode 126, when the device holder 30fits the test socket 122.

The conveyer 240 and/or the actuator unit 320 moves the device tray 10so that the socket-for-adjustment position detecting section 342 candetect the relative positions between at least one actuator fitting unit410 and the plurality of device holders 30 respectively. For example,the control section 340 controls the conveyer 240 and/or the actuatorunit 320 to sequentially cause all the device holders 30 on the devicetray 10 to fit the socket for adjustment 430, and determines thepositions to which all the devices under test 12 are to be arranged.

Next, the handler apparatus 100 causes the device holder 30 to fit theactuator 330, and adjusts the position of the device under test 12 onthe device holder 30 (S780). The control section 340 controls theconveyer 240 and/or the actuator unit 320 so that the device holder 30aligned on a predetermined column of the device tray 10 fits theactuator 330 of the actuator unit 320.

The actuator adjusting section 348 obtains the correlation between thepositions of the device holder 30 and the actuator fitting unit 410 fromthe detection result of the socket-for-adjustment position detectingsection 342, and determines the adjusted position of the inner unit 32(i.e., device under test 12) according to the device coordinates. Thatis, the actuator 330 adjusts the position of the device under test 12 onthe device holder 30, based on the relative position of the deviceholder 30 with respect to the socket for adjustment 430 in the state inwhich the socket for adjustment 430 fits the device holder 30 and therelative position of the socket fitting unit 420 with respect to thesocket for adjustment 430 in the state in which the socket foradjustment 430 fits the socket fitting unit 420.

FIG. 19 shows an exemplary configuration in which the actuator 330according to the present embodiment has fitted the device holder 30. Theouter catch section 332 grasps the pin insertion section 36 of thedevice holder 30, as well as the inner catch section 334 grasping theinner unit 32. When the outer unit 34 includes a lock mechanism forholding the inner unit 32, the outer catch section 332 grasps the outerunit 34, as well as release the lock mechanism to make the inner unit 32to be movable, and then the inner catch section 334 grasps the innerunit 32.

The inner catch section 334 is driven by the actuator driving section336, to move the inner unit 32 to the adjusted position determined bythe actuator adjusting section 348. In this way, the actuator 330 canadjust the position of the device under test 12 on the device holder 30,based on the amount of positional difference (i.e., device coordinates)of the device holder 30 to be caused between when the device holder 30fits the test socket 122, and when the device holder 30 fits the socketfor adjustment 430.

The control section 340 controls the actuator unit 320 so that thedevices under test 12 on all the device holders 30 aligned in thepredetermined columns of the device tray 10 are adjusted by the actuator330. In addition, the control section 340 controls the conveyer 240and/or the actuator unit 320 so that the devices under test 12 on thedevice holders 30 aligned in the other columns of the device tray 10 areadjusted by the actuator 330.

That is, the control section 340 sequentially moves the actuator unit320 so that the actuators 330 can be positioned in predeterminedpositions respectively corresponding to the plurality of device holders30. The actuator unit 320 sequentially moves the device holder 30 andthe actuator 330 aligned in the column corresponding to thepredetermined position to fit each other, each time it moves to thepredetermined position on the device tray 10, and the actuator 330adjusts the positions of the plurality of devices under test 12 held bythe plurality of device holders 30 respectively.

Next, the handler apparatus 100 conveys the device under test 12 to thetest section 220 (S790). Here, the handler apparatus 100 may convey thedevice under test 12 after heating the device under test 12 by thetemperature control section 212. Alternatively, the handler apparatus100 may heat the device under test 12 after the device tray 10 iscarried in the heating section 210.

The conveyer 240 conveys the device holder 30 on which the position ofthe device under test 12 has been adjusted, to cause it to fit the testsocket 122. Since the actuator 330 has adjusted the position of thedevice under test 12, the electrode 18 of the device under test 12 canbe electrically connected to the electrode 126 of the test socket 122,as shown in FIG. 2.

Next, the test apparatus connected to the handler apparatus 100 executesa test of the device under test 12 (S800). The handler apparatus 100discharges the device tray 10 in response to ending of the test (S810).

According to the handler apparatus 100 of the present embodimentdescribed above, the relative position between the device under test 12and the test socket 122 is detected and adjusted, prior to causing thedevice holder 30 holding the device under test 12 to fit the test socket122, and therefore electrical connection between the test apparatus andthe device under test 12 can be assured to a greater extent. Inaddition, prior to fitting of the actuator 330 and the device holder 30,the relative position, driving direction, and amount of driving of theactuator 330 are adjusted, which improves the position accuracy and thedriving accuracy of the actuator, and it becomes possible to adjust theposition of the device under test 12 with accuracy.

As described above, the handler apparatus 100 according to the presentembodiment performs adjustment by means of the tray for adjustment 20,by obtaining the socket coordinates by causing the socket fitting unit420 to fit the test socket 122, obtaining the first correlation bycausing the socket fitting unit 420 to fit the socket for adjustment430, obtaining the second correlation by causing the socket foradjustment 430 to fit the actuator fitting unit 410, and adjusting theactuator 330 by causing the actuator fitting unit 410 to fit theactuator 330, in the stated order. Alternatively, the handler apparatus100 may perform adjustment while transporting the tray for adjustment 20from the heating section 210 to the test section 220.

That is, the handler apparatus 100 carries the tray for adjustment 20into the heating section 210, causes the socket for adjustment 430 tofit the actuator fitting unit 410, and subsequently causes the actuatorfitting unit 410 to fit the actuator 330, thereby adjusting the actuatorfrom the relative position between the actuator fitting unit 410 and theactuator 330. Then, the socket fitting unit 420 is caused to fit thesocket for adjustment 430, and the relative position between theactuator fitting unit 410 and the socket fitting unit 420 is detected.

Next, the tray for adjustment 20 is conveyed to the test section 220,and the socket fitting unit 420 is caused to fit the test socket 122,and the first correlation and the second correlation are obtained.Accordingly, the handler apparatus 100 can execute the adjustment by thetray for adjustment 20, and therefore the tray for adjustment 20 can bedischarged to outside of the handler apparatus 100 via the heat removingsection 230. As stated above, the handler apparatus 100 can execute theadjustment by the tray for adjustment 20 appropriately, even when theorder of detection of the relative position of each portion is changed.

In the handler apparatus 100 according to the present embodiment, bothof the relative position of the device under test 12 with respect to thesocket for adjustment 430 and the relative position of the test socket122 with respect to the socket fitting unit 420 are detected so as todetect the amount of positional difference between the device under test12 and the test socket 122. When one of the above-described relativepositions is known, the handler apparatus 100 may omit detection of theother of the above-described relative positions. For example, thehandler apparatus 100 may omit detection of the relative position of thetest socket 122 from the subsequent test, by using the already detectedrelative position of the test socket 122 from the subsequent test of thedevice tray 10. It is also possible to omit one of the detection of theabove-described relative positions, by using information on the relativeposition inputted by a user or the like.

While the embodiments of the present invention have been described, thetechnical scope of the invention is not limited to the above describedembodiments. It is apparent to persons skilled in the art that variousalterations and improvements can be added to the above-describedembodiments. It is also apparent from the scope of the claims that theembodiments added with such alterations or improvements can be includedin the technical scope of the invention.

The claims, specification and drawings describe the processes of anapparatus, a system, a program and a method by using the terms such asoperations, procedures, steps and stages. When a reference is made tothe execution order of the processes, wording such as “before” or “priorto” is not explicitly used. The processes may be performed in any orderunless an output of a particular process is used by the followingprocess. In the claims, specification and drawings, a flow of operationsmay be explained by using the terms such as “first” and “next” for thesake of convenience. This, however, does not necessarily indicate thatthe operations should be performed in the explained order.

What is claimed is:
 1. A handler apparatus that conveys a device undertest to a first test socket from among a plurality of test sockets,comprising: a socket fitting unit to which the first test socket isremovably fit prior to a device holder holding the device under testbeing fit to the first test socket; a test-socket position detectingsection that detects a relative position of the socket fitting unit withrespect to the first test socket in a state in which the first testsocket is fit to the socket fitting unit; an actuator that adjusts aposition of the device under test on the device holder, based on thedetected relative position of the socket fitting unit; a conveyer thatconveys the device holder, in which the position of the device undertest has been adjusted, to the first test socket such that the deviceholder is fit to the first test socket in a state in which the firsttest socket is removed from the socket fitting unit; and a tray foradjustment on which the socket fitting unit is mounted, wherein theconveyer conveys the tray for adjustment so as to sequentially fit theplurality of test sockets to the socket fitting unit.
 2. The handlerapparatus according to claim 1, further comprising a socketimage-capturing section that captures an image of the first test socketand the socket fitting unit in the state in which the first test socketis fit to the socket fitting unit, wherein the test-socket positiondetecting section detects the relative position of the socket fittingunit with respect to the first test socket, based on an image-capturingresult of the socket image-capturing section.
 3. The handler apparatusaccording to claim 2, wherein the socket fitting unit has a referencemark observable from an opposite surface that is opposite to a surfaceto which the first test socket is fit, and the socket image-capturingsection captures an image of a region including the reference mark ofthe socket fitting unit and at least a part of the first test socket,from the opposite surface of the socket fitting unit.
 4. The handlerapparatus according to claim 3, wherein the socket fitting unit includesan opening through which at least a part of electrodes of the first testsocket is observable from the opposite surface in the state in which thefirst test socket is fit to the socket fitting unit, the socketimage-capturing section captures an image of a region including thereference mark of the socket fitting unit and at least a part of theelectrodes of the first test socket, and the test-socket positiondetecting section detects a relative position of the electrodes of thefirst test socket with respect to the reference mark of the socketfitting unit.
 5. The handler apparatus according to claim 4, furthercomprising a socket for adjustment to which the device holder and thesocket fitting unit are sequentially fit, wherein the actuator adjusts aposition of the device under test on the device holder, further based ona relative position of the device holder with respect to the socket foradjustment in a state in which the device holder is fit to the socketfor adjustment and a relative position of the socket fitting unit withrespect to the socket for adjustment in a state in which the socketfitting unit is fit to the socket for adjustment.
 6. The handlerapparatus according to claim 5, wherein the reference mark of the socketfitting unit is also observable from a surface to which the socket foradjustment is fit, and is provided in a position not covered by thesocket for adjustment in a state in which the socket for adjustment isfit to the socket fitting unit.
 7. The handler apparatus according toclaim 5, wherein the socket fitting unit is one of a plurality of socketfitting units mounted on the tray for adjustment, and the handlerapparatus comprises a control section that moves the socket foradjustment so as to sequentially fit the plurality of socket fittingunits to the socket for adjustment.
 8. The handler apparatus accordingto claim 5, wherein the socket fitting unit is one of a plurality ofsocket fitting units mounted on the tray for adjustment, and theconveyer conveys the tray for adjustment so as to sequentially fit theplurality of socket fitting units to the socket for adjustment.
 9. Atest apparatus that comprises the handler apparatus according to claim 1for conveying the device under test to the first test socket from amongthe plurality of test sockets, the test apparatus testing the deviceunder test and further comprising: a test head to be electricallyconnected to the device under test via the first test socket; and a testmodule testing the device under test via the test head.